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Tessent Testkompress High Quality Test Pattern Optimization Based On Critical Area Comprehensive Overview
Bill Keller, Product Engineer at Siemens EDA, introduces ATPG Boost, a set of new capabilities in This presentation briefly introduces a paper that presents a scan- This is the third in a series of four videos on
VLSI
Summary & Highlights for Tessent Testkompress High Quality Test Pattern Optimization Based On Critical Area
- Inefficient conventional fault model need to be replaced for the current technology nodes to be cost effective. A new fault model ...
- Recorded at DAC 2023. Presenter: Lee Harrison, Director, Product Marketing,
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- Presenters: Balajiraja Ravinarayanan, DFT Engineering Manager, Siemens and Kevin McGonigle, Tech Lead Production Team, ...
- How to simplify debugging of scan
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